자료유형 | 단행본 |
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서명/저자사항 | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis / Patrick Echlin. |
발행사항 | New York : Springer, 2010. |
형태사항 | xi, 330 p. : ill. (some col.) ; 26 cm. |
부분표제 | Sample preparation for scanning electron microscopy and x-ray microanalysis |
ISBN | 9781441946744 (pbk.) 1441946748 (pbk.) |
서지주기 | Includes bibliographical references and index. |
내용주기 | Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information. |
요약 | Here is a complete guide to preparing a variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors. |
일반주제명 | Scanning electron microscopyHandbooks manuals etc. X-ray microanalysisHandbooks manuals etc. |
소재불명도서 신고
No. | 등록번호 | 청구기호 | 소장처 | 도서상태 | 반납예정일 | 예약 | 서비스 | 매체정보 |
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1 | E137829 | 427.455 E18h 2010 |
중앙도서관/대출반납실/
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대출가능 |
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Sample Collection and Selection.- Sample Preparation Tools.- Sample Support.- Sample Embedding ?and Mounting.- Sample Exposure.- Sample Dehydration.- Sample Stabilization for Imaging in the SEM.- Samp...
Sample Collection and Selection.- Sample Preparation Tools.- Sample Support.- Sample Embedding ?and Mounting.- Sample Exposure.- Sample Dehydration.- Sample Stabilization for Imaging in the SEM.- Samp...