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Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis

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자료유형	단행본
서명/저자사항	Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis / Patrick Echlin.
발행사항	New York : Springer, 2010.
형태사항	xi, 330 p. : ill. (some col.) ; 26 cm.
부분표제	Sample preparation for scanning electron microscopy and x-ray microanalysis
ISBN	9781441946744 (pbk.) 1441946748 (pbk.)
서지주기	Includes bibliographical references and index.
내용주기	Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information.
요약	Here is a complete guide to preparing a variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors.
일반주제명	Scanning electron microscopy Handbooks manuals etc. X-ray microanalysis Handbooks manuals etc.